- Product Details
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Quick Details
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Place of Origin:
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Beijing, China
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Brand Name:
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Opto-Edu
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Model Number:
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A62.4501
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Operation modes:
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Contact mode, friction mode, extended modes of Tapping, phase
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Sample size:
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radius≤90mm,H≤20mm
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Max. scan range:
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X/Y: 20μm, Z: 2μm
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Resolution:
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X/Y: 0.2 nm, Z: 0.05nm
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Scan rate:
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0.6Hz~4.34Hz
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Scanning control:
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XY: 18-bit D/A, Z: 16-bit D/A
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Data sampling:
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One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
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PC connection:
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USB2.0
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Windows:
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Compatible with Windows 98/2000/XP/7/8
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Name:
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All-in-one New Scanning Electron Atomic Force
Quick Details
-
Warranty:
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3 years
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Theory:
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Scanning Electron Microscope
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Drawtube:
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Other
-
Place of Origin:
-
Beijing, China
-
Brand Name:
-
Opto-Edu
-
Model Number:
-
A62.4501
-
Operation modes:
-
Contact mode, friction mode, extended modes of Tapping, phase
-
Sample size:
-
radius≤90mm,H≤20mm
-
Max. scan range:
-
X/Y: 20μm, Z: 2μm
-
Resolution:
-
X/Y: 0.2 nm, Z: 0.05nm
-
Scan rate:
-
0.6Hz~4.34Hz
-
Scanning control:
-
XY: 18-bit D/A, Z: 16-bit D/A
-
Data sampling:
-
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
-
PC connection:
-
USB2.0
-
Windows:
-
Compatible with Windows 98/2000/XP/7/8
-
Name:
-
All-in-one New Scanning Electron Atomic Force
◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ Precision probe positioning device, laser spot alignment adjustment is very easy
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the
sample scan
◆ Precision probe positioning device, laser spot alignment adjustment is very easy
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the
sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
◆ Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%
◆ Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%
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