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BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope
BSEM-400 Field Emission Scanning Electron Microscope

BSEM-400 Field Emission Scanning Electron Microscope

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Quick Details

Brand Name:
BestScope
Model Number:
BSEM-400
Electron Optical System:
High Brightness Schottky Field Emission Electron Gun
Resolution:
1nm@30kV (SE),0.9nm@30kV (STEM)
Magnification:
1-1,000,000x
Detector and Extension:
Everhart-Thornley Detector (ETD)
Vacuum System:
Fully Automated Control
Camera:
Dual Cameras
Stage Range:
X: 120mm. Y: 115mm. Z: 50mm. R: 360° T: -10°- +90°

Quick Details

Warranty:
3 years
Theory:
Scanning Electron Microscope
Place of Origin:
Beijing, China
Brand Name:
BestScope
Model Number:
BSEM-400
Electron Optical System:
High Brightness Schottky Field Emission Electron Gun
Resolution:
1nm@30kV (SE),0.9nm@30kV (STEM)
Magnification:
1-1,000,000x
Detector and Extension:
Everhart-Thornley Detector (ETD)
Vacuum System:
Fully Automated Control
Camera:
Dual Cameras
Stage Range:
X: 120mm. Y: 115mm. Z: 50mm. R: 360° T: -10°- +90°
BSEM-400 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, BSEM-400 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
1. High resolution
The resolution is better than 1nm resolution at 30 kV.
2. Three-stage Condenser Lens and continuously adjustable beam current
Three-stage condenser lens design, wide beam current adjustable range.
3. Schottky field emission electron gun
Equipped with high brightness and long life Schottky field emission electron gun.
4. Non-immersion Magnetic Field Free Objective Lens
Non-immersion magnetic field free objective lens design, can directly observe magnetic samples.
5. Standard optical navigation mode
The standard optical navigation mode and software make analysis work easier.
6. Low vacuum mode
High-performance low vacuum secondary electron detectors, observe poorly conductive or non-conductive samples.
7. 1 min fast specimen switch
Easy and fast to switch the specimen.

PA-Glass fiber composite material
10kV / 500X / BSED Comp

Silica microspheres
10 kV / 80000X / BSED C OMP

Metal fracture
15 kV / 5000X / SE ETD

Metal microstructure (aluminum copper welding parts)
20kV / 10000X / BSED Comp

Cauliflower pollen
10kV / 50000X / SE ETD

Strontium barium titanate ceramics
10kV / 10000X / BSED Comp

Item
Specification
BSEM-400
Electron Optical System
High Brightness Schottky Field Emission Electron Gun
Resolution: 1nm@30kV (SE),0.9nm@30kV (STEM)
Magnification: 1-1,000,000x
Accelerating voltage: 200V-30kV
Detector and Extension
Everhart-Thornley Detector (ETD)
Low Vacuum Detector (LVD)
Backscattered Electron Detector (BSE)
Vibration Isolation table
Trackball & Knob Control Panel
Specimen Chamber
Vacuum system: Fully Automated Control
Low vacuum: Max 180 Pa
Camera
Dual Cameras
Optical navigation
In-chamber monitoring
Stage Range: X: 120mm. Y: 115mm. Z: 50mm. R: 360° T: -10°- +90°
Software
Windows. Nav-Cam, Gesture Quick Navigation. Auto Brightness & Contrast, Auto Focus, and Auto Stigmator.
Note: ● Standard Outfit, ○ Optional
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