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NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price
NANBEI scanning electron microscope afm atomic force microscopy price

NANBEI scanning electron microscope afm atomic force microscopy price

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≥1 Sets
US $25000
≥20 Sets
US $19750
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Quick Details

Place of Origin:
Henan, China
Brand Name:
NANBEI
Model Number:
AFM1000
Product name:
NANBEI scanning electron microscope afm atomic force microscopy price
Application:
Eductaion
Work mode:
FM-Tapping, optional contact, friction, phase,magnetic etc
Size:
Dia≤90mm,H≤20mm
Scanning range:
20 mmin XYdirection,2 mm in Z direction
Scanning resolution:
0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample:
±6.5mm
Pulse width ofthe motor approaches:
10±2ms
Image sampling point:
256x256,512x512
Scan angle:
0°~360°

Quick Details

Warranty:
1 year
Theory:
Stereo Microscope
Drawtube:
no
Place of Origin:
Henan, China
Brand Name:
NANBEI
Model Number:
AFM1000
Product name:
NANBEI scanning electron microscope afm atomic force microscopy price
Application:
Eductaion
Work mode:
FM-Tapping, optional contact, friction, phase,magnetic etc
Size:
Dia≤90mm,H≤20mm
Scanning range:
20 mmin XYdirection,2 mm in Z direction
Scanning resolution:
0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample:
±6.5mm
Pulse width ofthe motor approaches:
10±2ms
Image sampling point:
256x256,512x512
Scan angle:
0°~360°

NANBEI scanning electron microscope afm atomic force microscopy price

Our Product

Feature and Description

1.  Integrated scanning probe and sample stag enhanced the anti-interference ability.

2  Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.

3. By using the sample probe approaching manner,the needle could perpendicular to the sample scanning.

4.   Automatic pulse motor drive control sample probe vertical approaching, to achieve precise positioning of the scanning area.

5.   Sample scanning area of interest could freely moved by using the design of high precision sample mobile device.

6.   CCD observation system with optical positioning achieves real-time observation and positioning of the probe sample scan area.

7.   The design of electronic control system of modularization facilitated maintenance and continuous improvement of circuit.

8.   The integration of multiple scanning mode control circuit, cooperate with software system.

9.    Spring suspension which simple and practical enhanced anti-interference ability .


Picture for Our product


Usage and Application

Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of a substance by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a micro-force sensitive element. Will be a pair of weak force extremely sensitive micro-cantilever end fixed, the other end of the small tip close to the sample, then it will interact with it, the force will make the micro-cantilever deformation or movement state changes. When scanning the sample, the sensor can be used to detect these changes, we can get the distribution of force information, so as to obtain the surface morphology of nano-resolution information and surface roughness information.
Technical data

Work mode

FM-Tapping, optional contact, friction, phase,magnetic or electrostatic

Size

Φ≤90mm,H≤20mm

Scanningrange

20 mmin XYdirection,2 mm in Z direction.

Scanningresolution

0.2nm in XY direction,0.05nm in Z direction

Movementrange of sample

±6.5mm

Pulse width ofthe motor approaches

10±2ms

Image sampling point

256×256,512×512

Optical magnification

4X

Optical resolution

2.5 mm

Scan rate

0.6Hz~4.34Hz

Scan angle

0°~360°

Scanning control

18-bit D/A in XY direction,16-bit D/A in Z direction

Data sampling

14-bitA/D,double16-bit A/D multi-channel synchronous sampling

Feedback

DSP digital feedback

Feedback sampling rate

64.0KHz

Computer interface

USB2.0

Operating environment

Windows98/2000/XP/7/8


Packing and Shipping

Package : Wooden case package

Shipping : 5days

FAQ

1. How to choose the correct Atomic Force Microscope ?

Please send us your purpose,we will give you correct suggestion,divided into Teaching purpose and Scientific research purpose.

2. What is standard work mode?

Touch mode and Tapping mode are standard configuration.Others like friction, phase,magnetic or electrostatic are optional

3. What is payment terms ?

We accept 100% prepay by T/T,Western Union,Money Gram,L/C

4. What is your gurantte?

We have 1year gurantte time.

5. If machine broken,how to deal with ?

Please open the cargo when you receive it,if broken caused by transporation,claim for express,and at mean time,we will ship you new replace one.

Our Company

1.Company Show

2.Factory Show

Our Services

1.Certificaton

2.Warranty And After-sale Service

♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥

Contact Us

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+86-17326049340