Products
OPTO-EDU A62.4503 Laboratory research New Atomic Force Scanning Electron Microscope
OPTO-EDU A62.4503 Laboratory research New Atomic Force Scanning Electron Microscope

OPTO-EDU A62.4503 Laboratory research New Atomic Force Scanning Electron Microscope

FOB Reference Price: Get Latest Price
≥1 Pieces
US $35467
≥5 Pieces
US $30693
≥10 Pieces
US $28500
Free Inquiry
Customized Request
  • Product Details
  • {{item.text}}

Quick Details

Place of Origin:
Beijing, China
Brand Name:
Opto-Edu
Model Number:
A62.4503
Operation modes:
Contact mode, Tapping mode,phase,friction, MFM,EFM
Sample size:
radius≤90mm,H≤20mm
Max. scan range:
X/Y: 50μm, Z: 5μm
Resolution:
X/Y: 0.2 nm, Z: 0.05nm
Scan rate:
0.6Hz~4.34Hz
Scanning control:
XY: 18-bit D/A, Z: 16-bit D/A
Data sampling:
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Windows:
USB2.0, Compatible with Windows 98/2000/XP/7/8
Name:
Laboratory research New Atomic Force Scanning Electron Microscope
Features::
All-in-one design, smart structure and shape.

Quick Details

Warranty:
3 years
Theory:
Scanning Electron Microscope
Drawtube:
Other
Place of Origin:
Beijing, China
Brand Name:
Opto-Edu
Model Number:
A62.4503
Operation modes:
Contact mode, Tapping mode,phase,friction, MFM,EFM
Sample size:
radius≤90mm,H≤20mm
Max. scan range:
X/Y: 50μm, Z: 5μm
Resolution:
X/Y: 0.2 nm, Z: 0.05nm
Scan rate:
0.6Hz~4.34Hz
Scanning control:
XY: 18-bit D/A, Z: 16-bit D/A
Data sampling:
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Windows:
USB2.0, Compatible with Windows 98/2000/XP/7/8
Name:
Laboratory research New Atomic Force Scanning Electron Microscope
Features::
All-in-one design, smart structure and shape.
◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ Precision probe positioning device, laser spot alignment adjustment is very easy
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the
sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected
◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%
APP
Post My RFQ
WhatsApp
+86-17326049340