OPTO-EDU A63.7032 Tungsten Filament SE 300000x SEM Scanning Electron Microscope Price

OPTO-EDU A63.7032 Tungsten Filament SE 300000x SEM Scanning Electron Microscope Price

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US $145239

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Place of Origin:: Beijing, China

Brand Name:: OPTO-EDU

Model Number:: A63.7032

Resolution:: "3nm @30kV(SE) 4nm @30kV(BSE) 8nm @3kV(SE)"

Voltage:: 0.2kV~30kV

Magnification:: "1x~300,000x(film) 1x~1,000,000x(screen)"

Electron Gun:: Pre-Aligned Tungsten Filament

Vacuum System:: "Fully Auto Control Oil Free Vacuum <5x10-4 Pa"

Camera:: "Vertical Optical Navigation CCD Horizontal Monitoring CCD"

Quick Details

Warranty:: 3 years

Theory:: Scanning Electron Microscope

Drawtube:: N/A

Place of Origin:: Beijing, China

Brand Name:: OPTO-EDU

Model Number:: A63.7032

Resolution:: "3nm @30kV(SE) 4nm @30kV(BSE) 8nm @3kV(SE)"

Voltage:: 0.2kV~30kV

Magnification:: "1x~300,000x(film) 1x~1,000,000x(screen)"

Electron Gun:: Pre-Aligned Tungsten Filament

Vacuum System:: "Fully Auto Control Oil Free Vacuum <5x10-4 Pa"

Camera:: "Vertical Optical Navigation CCD Horizontal Monitoring CCD"

Specification	A63.7020	A63.7032	A63.7050
Resolution	3.9nm @20kV(SE) 4.5nm @20kV(BSE)	3nm @30kV(SE) 4nm @30kV(BSE) 8nm @3kV(SE)	1.0nm @15kV(SE) 1.5nm @1kV(SE) 0.8nm @30kV(STEM)
Voltage	0.5kV～20kV Optional 30kV	0.2kV～30kV	20V~ 30kV
Magnification	1x～300,000x	1x~300,000x（film） 1x~1,000,000x（screen）	1x~ 2,500,000x
Electron Gun	Pre-Aligned Tungsten Filament	Pre-Aligned Tungsten Filament	Schottky Field Emission Electron Gun, With In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System	Fully Auto Control Oil Free Vacuum <5×10-4 Pa	Fully Auto Control Oil Free Vacuum <5×10-4 Pa Optional Low Vacuum 5~1000Pa	Fully Auto Control Oil Free Vacuum Electron Gun <9x10-8Pa Sample Room <5x10-4Pa
Vacuum Pump	Mechanical pump×1, >200 L/min Turbo molecular pump×1, > 240 L/S	Mechanical pump×1, >200 L/min Turbo molecular pump×1, > 240 L/S	Mechanical pump×1, >6m3/h Turbo molecular pump×1, > 240 L/S, Ion pump x2, >25L/s
Working Stage	2 Axes Auto Stage, X：100 mm Y：100 mm	5 Axes Auto Stage, X：120 mm Y：115 mm Z：50 mm T: -10° ~+90° R: 360° Optional 3 Axes Auto Stage, A63.7032-A	5 Axes Auto Stage, X：120 mm Y：115 mm Z：50 mm T: -10° ~+90° R: 360°
Camera	Vertical Optical Navigation CCD	Vertical Optical Navigation CCD Horizontal Monitoring CCD	Vertical Optical Navigation CCD Horizontal Monitoring CCD
Detector	Secondary Electron Detector (ETD)	Secondary Electron Detector (ETD)	Secondary Electron Detector (ETD) High Angle Electron Detector Inlens
Software	SEM Operation Software, Language Chinese/English, Mutli Channel Display, Optical Navigation, Gesture Navigation, Auto Brightness Contrast, Auto Focus, Auto Astigmatism, Image Format TIFF,JPG,BMP,PNG
Computer	Working Station, Memory 16G, Hard Disk 512G, 24" Monitor, Win10 System
Install Room	L>3000 mm, W>4000mm, H>2300 mm, Temperature 20~25 ℃, Humidity<50%
Power Supply	AC 220 V(±10 %)，50 Hz，2 kVA
	Optional Accessories					Cata. No.
Optional	BSE	BSE	BSE	A50.7051
		EDS	EDS	EDS	A50.7052
		-	EBSD	EBSD	A50.7053
		-	-	EDS+EBSD	A50.7054
		-	-	STEM, 9-quadrant, total area 80mm2	A50.7055
		-	-	EBIC	A50.7056
		-	-	CL	A50.7057
		-	-	Knob Control Panel & Trackball	A50.7058
		-	-	Sample Exchange Warehouse	A50.7059
		-	-	Beam Gate & Electron Beam Exposure	A50.7060
		-	LVD, Low Vacuum Detector	-	A50.7061
		-	Double Anode (Tetrode Emission)	-	A50.7062
		Tungsten Filament(6pcs)	Tungsten Filament(6pcs)	-	A50.7063
		Large Size Image Stitching Software	Large Size Image Stitching Software	Large Size Image Stitching Software	A50.7070

▶ Low Voltage
For carbon material samples, at low voltage, the penetration depth is small, and the true morphology of the sample surface can be obtained with richer details.

▶ Feature Function
Intelligent Assisted Astigmatism
Directly reflect the astigmatism of the whole field of vision, through the mouse click clear, can quickly adjust the astigmatism to the best.

Autofocus
One-click focus for fast imaging.

Automatic Astigmatism
One-click astigmatism, improve efficiency.

Automatic Brightness Contrast
One-click automatic brightness contrast, gray level appropriate image.

Image Multiple Information Simultaneously
A63.7032 supports one-click switching between SE and BSE hybrid imaging, the morphology and composition information of samples can be observed simultaneously.

Fast image Rotation
Drag a line and the image is instantly "angled“.

Scanning electron microscope is not only limited to the observation of surface morphology, but also can be used to analyze the micro-components of the sample surface.
In addition to conventional secondary electron detector (ETD), backscattered electron detector (BSED), and X-ray energy dispersive spectrometer (EDS), many interfaces are reserved, such as electron backscattered diffraction (EBSD), cathode ray (CL) detectors can be integrated on A63.7032.

Quadripartite Backscattered Electron Detector (BSE)
-- Multichannel Imaging

The detector is exquisitely designed and highly sensitive. It adopts a 4-segment design, and can obtain shadow images and component distribution images in different directions without tilting the sample

SE image VS BSE image

In the backscattered electron imaging mode, the charge effect is weakened obviously, and more composition information can be obtained on the sample surface