DW-EDX3000 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured. The working principle is as above:
- Product Details
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Quick Details
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Place of Origin:
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Shanghai, China
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Brand Name:
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Drawell
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Model Number:
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DW-EDX3000
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Focal Length:
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--
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Wavelength Range:
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--
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Product name:
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Gold XRF Spectrometer
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Test Object:
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Precious metal
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Sample type:
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Solid sample
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Stability:
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0.05%(≥96%)
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Analysis Element:
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Au, Ag, Cu etc.
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Test Results:
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Display % in the software
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Non-destructive:
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yes
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Application:
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More than 60 elements from potassium (K) to uranium (U)
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Advantage:
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Rapid and accurate
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Packing:
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Individual pack
Quick Details
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Warranty:
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12 Months
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Size:
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Proper Size
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Weight:
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Light Weight
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Place of Origin:
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Shanghai, China
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Brand Name:
-
Drawell
-
Model Number:
-
DW-EDX3000
-
Focal Length:
-
--
-
Wavelength Range:
-
--
-
Product name:
-
Gold XRF Spectrometer
-
Test Object:
-
Precious metal
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Sample type:
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Solid sample
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Stability:
-
0.05%(≥96%)
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Analysis Element:
-
Au, Ag, Cu etc.
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Test Results:
-
Display % in the software
-
Non-destructive:
-
yes
-
Application:
-
More than 60 elements from potassium (K) to uranium (U)
-
Advantage:
-
Rapid and accurate
-
Packing:
-
Individual pack
Products Description
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Technical Specification
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Measurement precision
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0.05%(≥96%)
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Analysis range
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1ppm-99.99%
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Analytical range of elements
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More than 60 elements from potassium (K) to uranium (U)
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Measuring object
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powder, solid and liquid
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Measurement time
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(60~300)s
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Ambient temperature range
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(15-30)t)
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Relative humidity
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W70%
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Weight
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30kg
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Working voltage
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AC 110V/220V
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Configuration
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Single sample chamber
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Si PIN semiconductor detector
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Amplifier circuit
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High and low voltage power supplies
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X-ray tube
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Non-vacuum chamber
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Excitation Principle
Characteristic X-radiation of element
Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.
Scattering
It is the background of spectrum.
Photoelement
The photoelectron is the foundation of detector. In the sample, the X-ray intensity of every element is expressed
asI1,I2,I3,I4,I5......respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:
asI1,I2,I3,I4,I5......respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:
C=f(I1,I2+I3+I4+I5……)
This equation is too complicated and can be simplified as:
C=KlI1+KI2+KI3+K4I4+K5I5……
WhereC is the element content in the sample;I1,I2,I3,I4,I5......arc X-ray intensity of element respectively; K1,K2, K3.K4,K5 are coefficients which can be determined by measuring known standard sample to calibrate.
Spectrum of recovered Pt
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Element
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Content(%)
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Element
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Content(%)
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Cr
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0.001
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Fe
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0.001
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Ru
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2.011
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Ni
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0.218
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Rh
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13.25
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Co
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0.011
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Pd
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10.125
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Cu
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0.207
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Ag
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0.781
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Zn
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0.221
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Ir
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3.104
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Au
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2.302
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Pt
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77.816
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In
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2.011
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